Prof. Samukawa received the IEEE Nano 2016 Best paper award

10/07/2016

Prof. Seiji Samukawa received the Best Paper Award of the IEEE 16th International Conference on Nanotechnology (IEEE Nano 2016).

The award winning paper is “Defect-Free Germanium Etching for 3D Fin MOSFET Using Neutral Beam Etching.”

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