Prof. Samukawa received the IEEE Nano 2016 Best paper award

October 7, 2016

Prof. Seiji Samukawa received the Best Paper Award of the IEEE 16th International Conference on Nanotechnology (IEEE Nano 2016).

The award winning paper is “Defect-Free Germanium Etching for 3D Fin MOSFET Using Neutral Beam Etching.”

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