[6/24] The 3rd WPI-AIMR Joint Seminar in FY2016


The 3rd WPI-AIMR Joint Seminar in FY2016


Present status and future prospects of advanced transmission electron microscopy of nanomaterials


Prof. Nobuo Tanaka
(Institute for materials and systems for sustainability (IMaSS), Nagoya University)


June 24 (Fri.), 2016 14:30-15:30


Seminar Room, 2nd floor, WPI-AIMR Main Bldg.


Since the beginning of the 21 century, electron microscopy has experienced a kind of revolution on instrumentation1) such as development of (1)aberration correction of electromagnetic lenses for imaging of atomic structures by using scanning transmission electron microscopy(STEM)2) and conventional TEM3), (2)brighter and coherent electron sources, (3)3D electron tomography1,2), and (4)analytical capability of elements, their electronic structures and lattice vibrations4) by electron energy loss spectroscopy (EELS)2,5), and (5) in-situ observation techniques6,7,8) in gas and liquid-atmospheres7). By the advancement, details of environmental and energy-related materials such as catalysts and innovative oxides have been clarified in more actual viewpoints.
In the present talk, the author reviews the typical achievements on advanced electron microscopy around him and discusses about the future prospects of electron microscopy2), where the microscope becomes an almighty tool for advanced materials by overcoming some disadvantages involved previously. Finally, recent development of a new environmental high-voltage electron microscope8) and a spin-polarized/pulsed TEM9) is shown briefly in the last part of the talk.



  • 1) N. Tanaka, Science & Technology of Advanced Materials, 9(2008), 014111.
  • 2) N. Tanaka, "Scanning Transmission Electron Microscopy of Nanomaterials" (Imperial College Press, 2015).
  • 3) N. Tanaka, in “Advances in Imaging and Electron Physics” (Academic Press, 2008).
  • 4) O.L. Krivanek et al., Microscopy, 62(2013), 3.
  • 5) R.F. Egerton, “Electron Energy Loss Spectroscopy in TEM” (Plenum Press, 1996).
  • 6) P.L.Gai, “In-situ Electron Microscopy in Heterogeneous Catalysis” (Institute of Physics Publishing, 2003).
  • 7) H. Zheng et al., Science, 324(2009), 1309.
  • 8) N. Tanaka et al., Microscopy, 62(2013), 205.
  • 9) M. Kuwahara et al., Appl. Phys. Lett., 101(2012), 033102.



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