研究者・研究室一覧 Laboratories & Researchers

Alexander Shluger主任研究者 Ph.D.

研究テーマ

Theoretical modeling of:

• Defects and defect properties in insulators metal/insulator and semiconductor/insulator interfaces
• Atomic Force Microscopy imaging and molecular manipulation
• Photo-induced surface processes

主要業績

• A. Padovani, P. La Torraca, J. Strand, L. Larcher, A. Shluger, Dielectric breakdown of oxide films in electronic devices, - Nature Reviews Materials, 9, 607-627 (2024)
• J. W. Strand, P. La Torraca, A. Padovani, L. Larcher and A. L. Shluger, Dielectric breakdown in HfO₂ dielectrics: Using multiscale modeling to identify the critical physical processes involved in oxide degradation, - J. Appl. Phys. 131, 234501 (2022)
• J. W. Strand, J. Cottom, L. Larcher, A. L Shluger, Effect of electric field on defect generation and migration in HfO₂, - Phys. Rev. B 102, 014106 (2020)
• J. Strand, M. Kaviani, D. Gao, Al-M. El-Sayed, V. V Afanas’ev, A. L. Shluger, Intrinsic charge trapping in amorphous oxide films: status and challenges, - J. Phys.: Condens. Matter, 30, 233001 (2018)
• A. Padovani, D. Z. Gao, A. L. Shluger, L. Larcher, A microscopic mechanism of dielectric breakdown in SiO₂ films: An insight from multi-scale modelling, J. Appl. Phys. 121, 155101 (2017)
• Mehonic, M. Buckwell, L. Montesi, M. Singh Munde, D. Gao, S. Hudziak, R. J. Chater, S. Fearn, D. McPhail, M. Bosman, A. L. Shluger, A. J. Kenyon, Nanoscale Transformations in Metastable, Amorphous, Silicon‐Rich Silica, Adv. Materials 28, 7486-7493 (2016)
• Y. Wimmer, Al-M. El-Sayed, W. Gös, T. Grasser, A. L. Shluger, Role of hydrogen in volatile behaviour of defects in SiO₂-based electronic devices, - Proc. Royal Soc. A, 472, 20160009 (2016)
• A.-M. El-Sayed, M. B. Watkins, T. Grasser, V. V. Afanas'ev, and A. L. Shluger, Hydrogen-Induced Rupture of Strained Si-O Bonds in Amorphous Silicon Dioxide, - Phys. Rev. Lett. 114, 115503 (2015)
• K. Hayashi, P. V Sushko, Y. Hashimoto, A. L Shluger, Hideo Hosono, Hydride ions in oxide hosts hidden by hydroxide ions, - Nature Communications 5, 3551 (2014)
• Al-M. El-Sayed, M. B Watkins, V. V. Afanas' ev, and A. L. Shluger, Nature of intrinsic and extrinsic electron trapping in SiO₂, - Phys. Rev. B 89, 125201 (2014)

受賞歴

• David Tabor Medal and Prize of the Institute of Physics, UK for development of new theoretical models of defects at the surfaces and interfaces of insulators and mechanisms of imaging and manipulation of surface atoms and molecules using atomic force microscopy (AFM). (2020)
• Daiwa Adrian Prize of the Daiwa Anglo-Japanese Foundation for Exploration of Active Functionality in Abundant Oxide Materials Utilizing Unique Nanostructure. (2013)
• Fellow of the American Physical Society (2011)
• Fellow of the Institute of Physics (1996)

関連情報

• 2016年08月29日 スポットライト ヨーロッパにおける更なるブランド力向上に向けて
• 2014年09月29日 リサーチハイライト イオン液体: 微細空間における流れ
• 2014年02月24日 スポットライト 英国とのさらなる連携の強化へ
• 2012年07月30日 リサーチハイライト 酸化物材料: 隠れた層
• 2012年03月26日 リサーチハイライト 構造欠陥: 粒界を理解する
• 2010年12月27日 リサーチハイライト 単一分子イメージング: クロムで仕上げる