【4/24】第1回AIMRジョイントセミナー

2015年04月13日

2015年度 第1回AIMRジョイントセミナーのご案内

Title

Photo-assisted Scanning Probe Microscopy on Solar Cells

Speaker

高橋 琢二 教授
(東京大学 生産技術研究所 教授)

Date

2015年4月24日(金) 16:00-17:00

Venue

AIMR本館2階 セミナー室

Abstract

Solar cells attract a great deal of interests nowadays as important measures against the global warming. Among a lot of materials used for the solar cells, multi- or micro-crystalline materials have a big advantage in their fabrication costs. Since, however, those materials should include many grain boundaries (GBs), microscopic investigation is very informative to understand the behavior of the GBs. For such purposes, we have developed the photo-assisted scanning probe microscopy methods. In this seminar, the photovoltage distribution and photocarrier dynamics investigated by photo-assisted Kelvin probe microscopy (P-KFM) and the non-radiative recombination properties of the photocarriers investigated by photothermal atomic force microscopy (PT-AFM) on multicrystalline Si [mc-Si] and Cu(In,Ga)Se2 [CIGS] solar cells will be presented.


seminar_150413_01.png   seminar_150413_02.png
Fig. 1 (a) Surface potential, (b) photovoltage and (c) minority carrier lifetime evaluated by P-FKM on mc-Si solar cell.   Fig. 2 (a) Topography and (b)-(d) PT signal images on CIGS solar cell taken by PT-AFM under various incident photon energies.

問い合わせ先

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