セミナー・シンポジウム Seminars & Symposium

【6/24】第3回AIMRジョイントセミナー

2016年度 第3回AIMRジョイントセミナーのご案内

Title

Present status and future prospects of advanced transmission electron microscopy of nanomaterials

Speaker

田中 信夫 教授
（名古屋大学　未来材料・システム研究所）

Date

2016年6月24日（金） 14:30-15:30

Venue

AIMR本館2階 セミナー室

Abstract

Since the beginning of the 21 century, electron microscopy has experienced a kind of revolution on instrumentation¹⁾ such as development of (1)aberration correction of electromagnetic lenses for imaging of atomic structures by using scanning transmission electron microscopy(STEM)²⁾ and conventional TEM³⁾, (2)brighter and coherent electron sources, (3)3D electron tomography^1,2), and (4)analytical capability of elements, their electronic structures and lattice vibrations⁴⁾ by electron energy loss spectroscopy (EELS)^2,5), and (5) in-situ observation techniques^6,7,8) in gas and liquid-atmospheres⁷⁾. By the advancement, details of environmental and energy-related materials such as catalysts and innovative oxides have been clarified in more actual viewpoints.
In the present talk, the author reviews the typical achievements on advanced electron microscopy around him and discusses about the future prospects of electron microscopy²⁾, where the microscope becomes an almighty tool for advanced materials by overcoming some disadvantages involved previously. Finally, recent development of a new environmental high-voltage electron microscope⁸⁾ and a spin-polarized/pulsed TEM⁹⁾ is shown briefly in the last part of the talk.

 

References

• 1) N. Tanaka, Science & Technology of Advanced Materials, 9(2008), 014111.
• 2) N. Tanaka, "Scanning Transmission Electron Microscopy of Nanomaterials" (Imperial College Press, 2015).
• 3) N. Tanaka, in “Advances in Imaging and Electron Physics” (Academic Press, 2008).
• 4) O.L. Krivanek et al., Microscopy, 62(2013), 3.
• 5) R.F. Egerton, “Electron Energy Loss Spectroscopy in TEM” (Plenum Press, 1996).
• 6) P.L.Gai, “In-situ Electron Microscopy in Heterogeneous Catalysis” (Institute of Physics Publishing, 2003).
• 7) H. Zheng et al., Science, 324(2009), 1309.
• 8) N. Tanaka et al., Microscopy, 62(2013), 205.
• 9) M. Kuwahara et al., Appl. Phys. Lett., 101(2012), 033102.

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