Jiri Orava Ph.D.

職名 助手
研究室 AIMR Joint Research Center (Cambridge)
所在地 片平キャンパス AIMRラボ棟305号室
(〒980-8577 仙台市青葉区片平2-1-1)
Cambridge Joint Laboratory
Room 204, Annex Building,Department of Materials Science & Metallurgy
University of Cambridge
(Pembroke Street, CB2 8BG Cambridge, UK)
Tel +441223334357 (Cambridge Joint Laboratory)
E-Mail jo316@cam.ac.uk


  • Synthesis, physical-chemical properties of chalcogenide glasses (2005-)
  • Photonic structures from chalcogenide glasses (2006-)
  • Optical and electrical data recording in amorphous semiconducting thin films of chalcogenides (2007-)
  • Crystallization and stability of supercooled liquids (2011-)


  • Reversible amorphous-to-amorphous transitions in chalcogenide films: correlating changes in structure and optical properties, Adv. Funct. Mater., doi: 10.1002/adfm.201202461, (2012), M. Kalyva, J. Orava, A. Siokou, M. Pavlista, T. Wagner, S. N. Yannopoulos
  • Ultra-fast calorimetry study of Ge2Sb2Te5 crystallization between dielectric layers, Appl. Phys. Lett., 101, (2012), 091906, J. Orava, A. L. Greer, B. Gholipour, D. W. Hewak, C. E. Smith
  • Characterization of supercooled liquid Ge2Sb2Te5 and its crystallization by ultrafast heating calorimetry, Nature Mater., 11, (2012), 279-283, J. Orava, A. L. Greer, B. Gholipour, D. W. Hewak, C. E. Smith
  • Soft imprinting lithography of a bulk chalcogenide glass, Opt. Mater. Express, 1, (2011), 796-802, J. Orava, T. Kohoutek, A. L. Greer, H. Fudouzi
  • Optical properties and phase change transition in Ge2Sb2Te5 flash evaporated thin films studied by temperature dependent spectroscopic ellipsometry, J. Appl. Phys., 104, (2008), 043523, J. Orava, T. Wagner, J. Sik, J. Prikryl, M. Frumar, L. Benes


  • Dean award for the best Ph.D. thesis(2009)
  • 2008 - 3rd place at Chemistry Awards (French Embassy) and Rhodia Company,Czech Republic(2008)
  • Prof M. Jurecek award for the best diploma thesis (2005)