Jiri Orava Ph.D.

Job Research Associate
Laboratory AIMR Joint Research Center (Cambridge)
Address Room 305, AIMR Main Building, Katahira Campus
(2-1-1, Katahira, Aoba-ku, Sendai 980-8577)
Cambridge Joint Lab
Room 204, Annex Building,Department of Materials Science & Metallurgy,University of Cambridge
(Pembroke Street, CB2 8BG Cambridge, UK)
Tel +441223334357 (Cambridge)
E-Mail jo316@cam.ac.uk
Related Site

Research Interests

  • Synthesis, physical-chemical properties of chalcogenide glasses (2005-)
  • Photonic structures from chalcogenide glasses (2006-)
  • Optical and electrical data recording in amorphous semiconducting thin films of chalcogenides (2007-)
  • Crystallization and stability of supercooled liquids (2011-)

Main Publication List

  • Reversible amorphous-to-amorphous transitions in chalcogenide films: correlating changes in structure and optical properties, Adv. Funct. Mater., doi: 10.1002/adfm.201202461, (2012), M. Kalyva, J. Orava, A. Siokou, M. Pavlista, T. Wagner, S. N. Yannopoulos
  • Ultra-fast calorimetry study of Ge2Sb2Te5 crystallization between dielectric layers, Appl. Phys. Lett., 101, (2012), 091906, J. Orava, A. L. Greer, B. Gholipour, D. W. Hewak, C. E. Smith
  • Characterization of supercooled liquid Ge2Sb2Te5 and its crystallization by ultrafast heating calorimetry, Nature Mater., 11, (2012), 279-283, J. Orava, A. L. Greer, B. Gholipour, D. W. Hewak, C. E. Smith
  • Soft imprinting lithography of a bulk chalcogenide glass, Opt. Mater. Express, 1, (2011), 796-802, J. Orava, T. Kohoutek, A. L. Greer, H. Fudouzi
  • Optical properties and phase change transition in Ge2Sb2Te5 flash evaporated thin films studied by temperature dependent spectroscopic ellipsometry, J. Appl. Phys., 104, (2008), 043523, J. Orava, T. Wagner, J. Sik, J. Prikryl, M. Frumar, L. Benes

Award

  • Dean award for the best Ph.D. thesis(2009)
  • 2008 - 3rd place at Chemistry Awards (French Embassy) and Rhodia Company,Czech Republic(2008)
  • Prof M. Jurecek award for the best diploma thesis (2005)